Description: Aquila Instruments nkd,The most powerful thin film thickness measurement systems available
spectrometer (87) spectrophotometer (68) thickness measurement (17) ellipsometry (7) thin film thickness measurement (4) thin film measurement (4) film thickness measurement (4) thin film analysis (1) thin film properties (1) spectral reflectance (1)
Aquila Instruments manufactures the nkd, the most advanced thin film measurement instrument available. The nkd provides non destructive analysis of film thickness, refractive index and absorption for single and multi-layer films on transparent and absorbing substrates. Aquila guarantees expert support and a tailored solution to your thin film measurement application. Please follow the links to the right for more information. ©Aquila Instruments 2008