Description: Elemental Analysis on Electron Microscopes, on Benchtop Micro-XRF and TXRF Spectrometers and on Handheld / Mobile / Portable XRF Instruments
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Bruker Nano Analytics' product portfolio includes a unique range of analytical tools for materials characterization in electron microscopes:
Besides this unparalleled range of analytical tools for electron microscopes, Bruker also offers a variety of benchtop X-ray fluorescence micro analyzers ( micro-XRF ) for spatially resolved composition analysis and total reflection X-ray fluorescence ( TXRF ) instruments for trace element analysis for a multitude of applications in industry and research.
Last but not least, BNA's handheld/mobile/portable X-ray fluorescence spectrometers ( handheld XRF ) have the capability to non-destructively quantify or qualify nearly any element from magnesium to uranium (depending on specific instrument configurations), delivering fast, on-site elemental analysis in a broad range of application fields.