Description: Noncontact eddy current meters measure the ohms/square, ohms/sq, thickness, Ohms-cm of thin films, silicon wafers, TCO, conductive coatings, solar, PV, metalized materials and more.
vacuum (570) instrumentation (507) inline (224) in situ (69) thickness (23) delcom instruments offers sheet resistance meters (2) meters and other testing equipment that measure in sheet resista (2) ohms/sq (2) mhos/sq (2) and are used in benchtop (2)
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