ADVANCED IMAGING AND DIFFRACTION TOOLS FOR TRANSMISSION ELECTRON MICROSCOPY
ASTAR device uses novel TEM based orientation/phase mapping technique to characterize any material down to 1 nm scale based on collection of precession electron diffraction patterns (PED). In combination with TOPSPIN acquisition of orientation / phase / strain/ STEM maps is possible
Novel Automated Strain Mapping Solution for TEM/STEM (Patent pending) based on nanobeam precession diffraction patterns and STEM reference image acquisition. Precision up to 0.02% (200kV FEG) with spatial resolution < 2 nm (FEG TEM). In combination with TOPSPIN acquisition of orientation /phase /strain /STEM maps is possible.
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