delcominst.com - Achieve Higher Material and Thin Film Quality | Delcom Instruments

Description: Non-Contact measurement of: Sheet Resistance Resistivity Thickness Emissivity Request Free 60-Day Trial Instrument Achieve Higher Material and Thin Film Quality Below are some of the many materials Delcom sensors can characterize

vacuum (570) instrumentation (507) inline (224) in situ (69) thickness (23) delcom instruments offers sheet resistance meters (2) meters and other testing equipment that measure in sheet resista (2) ohms/sq (2) mhos/sq (2) and are used in benchtop (2)

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Non-Contact measurement of:

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